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Displacement Damage and Ionization Effects on Waveguide-Integrated Germanium-Silicon p-i-n Photodiodes

https://doi.org/10.1109/TNS.2025.3532086

Arnold, Kellen P; Musibau, Solomon; Dattilo, Hannah M; Sutton, Hayden J; Frankowski, Steven L; Berciano, Mathias; Zhang, En Xia; McCurdy, Michael W; Crespillo, Miguel L; Hattar, Khalid; et al (April 2025, IEEE Transactions on Nuclear Science)

Free, publicly-accessible full text available April 1, 2026
Electrical Measurement of Cell-to-Cell Variation of Critical Charge in SRAM and Sensitivity to Single-Event Upsets by Low-Energy Protons

https://doi.org/10.1109/TNS.2021.3061672

Cannon, James M.; Loveless, T. Daniel; Estrada, Rafael; Boggs, Ryan; Lawrence, S. P.; Santos, Gabriel; McCurdy, Michael W.; Sternberg, Andrew L.; Reising, Donald R.; Finzell, Thomas; et al (May 2021, IEEE Transactions on Nuclear Science)

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